Design of a process variation tolerant self-repairing SRAM for yield enhancement in nanoscaled CMOS
- Saibal Mukhopadhyay
- Keejong Kim
- et al.
- 2007
- IEEE Journal of Solid-State Circuits
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.