Endurance limits of MLC NAND flash
- Thomas Parnell
- Celestine Mendler-Dünner
- et al.
- 2015
- IEEE ICC 2015
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40 results for Thomas Mittelholzer
Phase change memory reliability: A signal processing and coding perspective
- Haralampos Pozidis
- Thomas Mittelholzer
- et al.
- 2015
- IEEE Transactions on Magnetics
Enumerative modulation codes based on sliding-window substitutions
- Thomas Mittelholzer
- Roy D. Cideciyan
- 2014
- ISIT 2014
Using adaptive read voltage thresholds to enhance the reliability of MLC NAND flash memory systems
- Nikolaos Papandreou
- Thomas Parnell
- et al.
- 2014
- GLSVLSI 2014
Partial reverse concatenation for data storage
- Roy D. Cideciyan
- Robert Hutchins
- et al.
- 2014
- APSIPA 2014
Modelling of the threshold voltage distributions of sub-20nm NAND flash memory
- Thomas Parnell
- Nikolaos Papandreou
- et al.
- 2014
- GLOBECOM 2014
On the capacity of memoryless rewritable storage channels
- Luis A. Lastras-Montaño
- Michele M. Franceschini
- et al.
- 2014
- IEEE Trans. Inf. Theory
Reliable MLC data storage and retention in phase-change memory after endurance cycling
- 2013
- IMW 2013
A framework for reliability assessment in multilevel phase-change memory
- 2012
- IMW 2012
Drift-tolerant multilevel phase-change memory
- 2011
- IMW 2011