Impact of stress-induced backflow on full-chip electromigration risk assessment
- Haldun Haznedar
- Martin Gall
- et al.
- 2006
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.