Direct observation of reconstruction induced changes of surface stress for Sb on Si(111)P. KuryP. Zahlet al.2004Analytical and Bioanalytical Chemistry
Surfactant-mediated epitaxy of Ge on Si(111): Beyond the surfaceTh. SchmidtR. Krögeret al.2005Applied Physics Letters
Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperaturesP. KuryP. Zahlet al.2004Review of Scientific Instruments
Precise calibration for surface stress induced optical deflection measurementsP. KuryP. Zahlet al.2004Review of Scientific Instruments