Impact ionization MOS (I-MOS) - Part II : Experimental results
- Kailash Gopalakrishnan
- Raymond Woo
- et al.
- 2005
- IEEE Transactions on Electron Devices
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.