Triangulating to a defect's physical coordinates using multiple supply pad iDDQS: Test chip results
- Jim Plusquellic
- Dhruva Acharyya
- et al.
- 2006
- ISTFA 2006
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4 results for Chintan Patel
Sensitivity analysis of quiescent signal analysis for defect detection
- Dhruva Acharyya
- Abhishek Singh
- et al.
- 2006
- DBT 2006
Quiescent-signal analysis: A multiple supply pad /DDQ method
- Jim Plusquellic
- Dhruva Acharyya
- et al.
- 2006
- IEEE Design and Test of Computers
Power supply transient signal analysis for defect-oriented test
- Jim Plusquellic
- Abhishek Singh
- et al.
- 2003
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems