Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence
- S. Polonsky
- D.R. Knebel
- et al.
- 2000
- ISSCC 2000
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24 results for M. McManus
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis
- M. McManus
- J.A. Kash
- et al.
- 2000
- Microelectronics Reliability
Picosecond Imaging Circuit Analysis of the IBM G6 Microprocessor Cache
- Moyra McManus
- Pia Sanda
- et al.
- 1999
- ISTFA 1999
Diagnosis and characterization of timing-related defects by time-dependent light emission
- D.R. Knebel
- P.N. Sanda
- et al.
- 1998
- IEEE ITC 1998