Diagnosis and characterization of timing-related defects by time-dependent light emission
- D.R. Knebel
- P.N. Sanda
- et al.
- 1998
- IEEE ITC 1998
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24 results for M. McManus
Testing and diagnostics of CMOS circuits using light emission from off-state leakage current
- Franco Stellari
- Peilin Song
- et al.
- 2004
- IEEE Transactions on Electron Devices
I/O interface latchup analysis using optical and electrical testing
- Franco Stellari
- Peilin Song
- et al.
- 2004
- Electronic Device Failure Analysis
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis
- M. McManus
- J.A. Kash
- et al.
- 2000
- Microelectronics Reliability