Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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1 result for Philippe J. Roussel

Charge trapping and dielectric reliability of SiO₂-Al₂O₃ gate stacks with TiN electrodes
- - Andreas Kerber
  - Eduard Cartier
  - et al.
- 2003
- IEEE Transactions on Electron Devices