Spectroscopic anisotropy micro-ellipsometry for determination of lateral dimensions of form birefringent structures
- H. Bloeß
- J.W. Schultze
- et al.
- 2002
- Thin Solid Films
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.