FinFET design considerations based on 3-D simulation and analytical modeling
- Gen Pei
- Jakub Kedzierski
- et al.
- 2002
- IEEE Transactions on Electron Devices
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2 results for Edwin Chih-Chuan Kan
Characterization of RF power BJT and improvement of thermal stability with nonlinear base ballasting
- Jaejune Jang
- Edwin C. Kan
- et al.
- 1998
- IEEE Journal of Solid-State Circuits