CMOS latch metastability characterization at the 65-nm-technology node
- Manjul Bhushan
- Mark B. Ketchen
- et al.
- 2008
- ICMTS 2008
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150 results for Mark B. Ketchen
Measurement of thermal time constant in 65-nm PD-SOI technology with sub-ns resolution
- Mark B. Ketchen
- Kai Xiu
- et al.
- 2007
- SOI 2007
Ring oscillator based test structure for NBTI analysis
- Mark B. Ketchen
- Manjul Bhushan
- et al.
- 2007
- ICMTS 2007
On the connection of SRAM cell stability with switching history in partially depleted SOI technology
- Brian L. Ji
- Hussein I. Hanafi
- et al.
- 2006
- ICSICT 2006
Data analysis techniques for CMOS technology characterization and product impact assessment
- Anne Gattiker
- Manjul Bhushan
- et al.
- 2006
- IEEE ITC 2006
Ring oscillator based technique for measuring variability statistics
- Manjul Bhushan
- Mark B. Ketchen
- et al.
- 2006
- ICMTS 2006
Optimizing history effects in 65nm PD-SOI CMOS
- Q. Liang
- T. Kawamura
- et al.
- 2006
- IEEE International SOI Conference 2006
Circuit to measure high speed pulse I-V characteristics with only DC I/O's
- Mark B. Ketchen
- Manjul Bhushan
- et al.
- 2005
- IEEE International SOI Conference 2005
High speed test structures for in-line process monitoring and model calibration
- Mark Ketchen
- Manjul Bhushan
- et al.
- 2005
- ICMTS 2005
Switching delay variability in NMOS and PMOS PDSOI passgate circuits
- Mark Ketchen
- Manjul Bhushan
- et al.
- 2005
- VLSI Technology 2005