Photoluminescence characterization of defects in thermal oxideHiroyuki NishikawaJames H. Stathis1999MRS Proceedings 1999
Oxygen-deficient centers and excess si in buried oxide using photoluminescence spectroscopyJ. Stathis1999Physical Review B - CMMP
Defects in thermal oxide studied by photoluminescence spectroscopyHiroyuki NishikawaJames H. Stathiset al.1999Applied Physics Letters