Electrical test sites for AMLCD-TFT array process characterization
- E.G. Colgan
- R.J. Polastre
- et al.
- 1998
- MRS Spring Meeting 1998
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
Date
Featured collections
Popular topics
3 results for M. Takeichi
Optimization of extrinsic TFT mobility on 550 mm × 650 mm large glass
- M. Takeichi
- S. Takahashi
- et al.
- 1998
- Vacuum
Thin-film-transistor process-characterization test structures
- E.G. Colgan
- R.J. Polastre
- et al.
- 1998
- IBM J. Res. Dev