Breakdown measurements of ultra-thin SiO2 at low voltage
- J.H. Stathis
- A. Vayshenker
- et al.
- 2000
- VLSI Technology 2000
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4 results for Charles J. Montrose
Cosmic ray soft error rates of 16-Mb DRAM memory chips
- James F. Ziegler
- Martin E. Nelson
- et al.
- 1998
- IEEE Journal of Solid-State Circuits
Accelerated testing for cosmic soft-error rate
- J.F. Ziegler
- H.P. Muhlfeld
- et al.
- 1996
- IBM J. Res. Dev
IBM experiments in soft fails in computer electronics (1978-1994)
- J.F. Ziegler
- H.W. Curtis
- et al.
- 1996
- IBM J. Res. Dev