Multiple-Vt Solutions in Nanosheet Technology for High Performance and Low Power ApplicationsRuqiang BaoReinaldo A. Vegaet al.2019IEDM 2019
Full Bottom Dielectric Isolation to Enable Stacked Nanosheet Transistor for Low Power and High Performance ApplicationsJ. ZhangS. Pancharatnamet al.2019IEDM 2019
Impact of Gate Stack Thermal Budget on NBTI Reliability in Gate-All-Around Nanosheet P-type DevicesHuimei ZhouMiaomiao Wanget al.2023IRPS 2023
Middle of Line (MOL) Process Investigation in Ring Oscillator failureVictor ChanM. Bergendahlet al.2020ASMC 2020
Failure isolation in ring oscillator circuit and defect detection in CMOS technology researchVictor ChanM. Bergendahlet al.2019ASMC 2019
Yield learning methodologies and failure isolation in ring oscillator circuit for CMOS technology researchVictor ChanKangguo Chenget al.2019IEEE Trans Semicond Manuf