Characterization of random process variations using ultralow-power, high-sensitivity, bias-free sub-threshold process sensor
- Mesut Meterelliyoz
- Peilin Song
- et al.
- 2010
- IEEE TCAS-I
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92 results for Franco Stellari
On-chip power supply noise measurement using time resolved emission (TRE) waveforms of light emission from off-state leakage current (LEOSLC)
- Franco Stellari
- Peilin Song
- et al.
- 2009
- IEEE ITC 2009
Mapping systematic and random process variations using light emission from off-state leakage
- Franco Stellari
- Peilin Song
- et al.
- 2009
- IRPS 2009
Operational amplifier based test structure for quantifying transistor threshold voltage variation
- Brian L. Ji
- Dale J. Pearson
- et al.
- 2009
- IEEE Trans Semicond Manuf
A packaging solution for optically testing wire-bonded chips
- Alberto Tosi
- Franco Stellari
- et al.
- 2008
- IEEE Transactions on Advanced Packaging
Optical diagnostics for IBM POWER6 TM Microprocessor
- Peilin Song
- Stephen Ippolito
- et al.
- 2008
- IEEE ITC 2008
Evaluating PICA capability for future low voltage SOI chips
- Franco Stellari
- Peilin Song
- et al.
- 2008
- ISTFA 2008
Operational amplifier based test structure for transistor threshold voltage variation
- Brian L. Ji
- Dale J. Pearson
- et al.
- 2008
- ICMTS 2008
Hot-carrier photoemission in scaled CMOS technologies: A challenge for emission based testing and diagnostics
- Alberto Tosi
- Franco Stellari
- et al.
- 2006
- IRPS 2006
Switching time extraction of CMOS gates using time-resolved emission (TRE)
- Franco Stellari
- Alberto Tosi
- et al.
- 2006
- IRPS 2006