1D and 2D Time-Resolved Emission Measurements of Circuits Fabricated in 14 nm Technology Node
- Franco Stellari
- Andrea Bahgat Shehata
- et al.
- 2020
- IPFA 2020
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97 results for Peilin Song
AC conductivity analysis as a measure of low k dielectric capacitor reliability degradation due to moisture ingress
- Cyril Cabral
- Robert B. Laibowitz
- et al.
- 2020
- Microelectronic Engineering
Humidity Penetration Impact on Integrated Circuit Performance and Reliability
- Franco Stellari
- Cyril Cabral
- et al.
- 2019
- IEDM 2019
Case Study of Advanced Diagnostic Techniques for Multi Port Register File
- Uma Srinivasan
- William Huott
- et al.
- 2019
- NATW 2019
Innovate Practices on CyberSecurity of Hardware Semiconductor Devices
- Alfred L. Crouch
- Peter Levin
- et al.
- 2019
- VTS 2019
Novel IC sub-threshold IDDQ signature and its relationship to aging during high voltage stress
- Franco Stellari
- Naigang Wang
- et al.
- 2018
- ESSDERC 2018
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission
- Franco Stellari
- Alan J. Weger
- et al.
- 2018
- IRPS 2018
Device channel temperature measurement using NIR emission
- Alan J. Weger
- Franco Stellari
- et al.
- 2017
- ISTFA 2017
Automated emission data registration and segmentation for IC analysis
- Franco Stellari
- Peilin Song
- 2016
- ISTFA 2016
Extending the resolution of emission images beyond diffraction limits using deconvolution
- Fei Lan
- Franco Stellari
- et al.
- 2016
- ISTFA 2016