Broken scan chain diagnostics based on time-integrated and time-dependent emission measurements
- Franco Stellari
- Peilln Song
- et al.
- 2004
- ISTFA 2004
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95 results for Peilin Song
Delay chain based programmable jitt+er generator
- Tian Xia
- Peilin Song
- et al.
- 2004
- ETS 2004
A novel scan chain diagnostics technique based on light emission from leakage current
- Peilin Song
- Franco Stellari
- et al.
- 2004
- IEEE ITC 2004
Dynamic latchup study using transmission line pulses and picosecond imaging circuit analysis
- Franco Stellari
- Alan J. Weger
- et al.
- 2004
- ESSDERC/ESSCIRC 2004
Testing of ultra low voltage VLSI chips using the superconducting single-photon detector (SSPD)
- Franco Stellari
- Peilin Song
- 2004
- Microelectronics Reliability
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- K. Chatty
- P.E. Cottrell
- et al.
- 2004
- IRPS 2004
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- K. Chatty
- P.E. Cottrell
- et al.
- 2004
- IRPS 2004
Time-resolved emission testing challenges for low voltage CMOS technologies
- Peilin Song
- Franco Stellari
- et al.
- 2003
- LEOS 2003
Optical and Electrical Testing of Latchup in I/O Interface Circuits
- Franco Stellari
- Peilin Song
- et al.
- 2003
- IEEE ITC 2003
Time-Resolved Optical Measurements from 0.13μm CMOS Technology Microprocessor using a Superconducting Single-Photon Detector
- Franco Stellari
- Peilin Song
- et al.
- 2003
- ISTFA 2003