The Impact of BEOL Lithography Effects on the SRAM Cell Performance and Yield
- Ying Zhou
- Rouwaida Kanj
- et al.
- 2009
- ISQED 2009
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210 results for Rajiv V. Joshi
Design of sub-90 nm low-power and variation tolerant PD/SOI SRAM cell based on dynamic stability metrics
- Rajiv V. Joshi
- Saibal Mukhopadhyay
- et al.
- 2009
- IEEE Journal of Solid-State Circuits
Root-finding methods for assessing SRAM stability in the presence of random dopant fluctuations
- Rouwaida Kanj
- Zhuo Li
- et al.
- 2009
- IEEE Trans Semicond Manuf
Evaluation and alleviation of SOI impacts on SRAM functionality and yield
- Antonio R. Pelella
- Rajiv Joshi
- et al.
- 2008
- IEEE International SOI Conference 2008
SRAM methodology for yield and power efficiency: Per-element selectable supplies and memory reconfiguration schemes
- Rouwaida Kanj
- Rajiv V. Joshi
- et al.
- 2008
- ISLPED 2008
Variability analysis for sub-100nm PD/SOI sense-amplifier
- Saibal Mukhopadhyay
- Rajiv V. Joshi
- et al.
- 2008
- ISQED 2008
A root-finding method for assessing SRAM stability
- Rouwaida Kanj
- Zhuo Li
- et al.
- 2008
- ISQED 2008
Statistical evaluation of split gate opportunities for improved 8T/6T column-decoupled SRAM cell yield
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2008
- ISQED 2008
The impact of aging effects and manufacturing variation on SRAM soft-error rate
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2008
- IEEE T-DMR
Design considerations for PD/SOI SRAM: Impact of gate leakage and threshold voltage variation
- Rouwaida Kanj
- Rajiv V. Joshi
- et al.
- 2008
- IEEE Trans Semicond Manuf