Evaluation and alleviation of SOI impacts on SRAM functionality and yield
- Antonio R. Pelella
- Rajiv Joshi
- et al.
- 2008
- IEEE International SOI Conference 2008
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199 results for Rajiv V. Joshi
SRAM methodology for yield and power efficiency: Per-element selectable supplies and memory reconfiguration schemes
- Rouwaida Kanj
- Rajiv V. Joshi
- et al.
- 2008
- ISLPED 2008
A root-finding method for assessing SRAM stability
- Rouwaida Kanj
- Zhuo Li
- et al.
- 2008
- ISQED 2008
Variability analysis for sub-100nm PD/SOI sense-amplifier
- Saibal Mukhopadhyay
- Rajiv V. Joshi
- et al.
- 2008
- ISQED 2008
Statistical evaluation of split gate opportunities for improved 8T/6T column-decoupled SRAM cell yield
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2008
- ISQED 2008
A floating-body dynamic supply boosting technique for low-voltage sram in nanoscale PD/SOI CMOS technologies
- Rajiv Joshi
- Rouwaida Kanj
- et al.
- 2007
- ISLPED 2007
A high-performance, low leakage, and stable SRAM row-based back-gate biasing scheme in FinFET technology
- Rajiv V. Joshi
- Keunwoo Kim
- et al.
- 2007
- VLSID 2007
Leakage analysis for FinFET devices using self-consistent electro-thermal modeling
- Satish Kumar
- Rajiv V. Joshi
- et al.
- 2007
- ICICDT 2007
SRAM yield sensitivity to supply voltage fluctuations and its implications on Vmin
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2007
- ICICDT 2007
Phonon Boltzmann transport based electro-thermal analysis of nano-scale asymmetrical double-gate finfet device
- Chunjian Ni
- Rajiv V. Joshi
- et al.
- 2007
- ASME Electronic and Photonics Packaging Division 2007