Device design issues for a high-performance bipolar technology with Si or SiGe epitaxial base
- J.N. Burghartz
- J.D. Cressler
- et al.
- 1991
- ESSDERC 1991
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236 results for Keith A. Jenkins
High-Performance Bipolar Technology for Improved ECL Power Delay
- J. Warnock
- J.D. Cressler
- et al.
- 1991
- IEEE Electron Device Letters
Device design issues for a high-performance technology with Si or SiGe epitaxial base
- J.N. Burghartz
- J.D. Cressler
- et al.
- 1991
- Microelectronic Engineering
Novel In-Situ Doped Polysilicon Emitter Process with Buried Diffusion Source (Bds)
- Joachim N. Burghartz
- Andrew C. Megdanis
- et al.
- 1991
- IEEE Electron Device Letters
Corroborating Cutoff Frequency Measurements with DC Gain Measurements
- Keith A. Jenkins
- 1991
- IEEE Trans. Instrum. Meas.
The Design and Optimization of High-Performance, Double-Poly Self-Aligned p-n-p Technology
- Pong-Fei Lu
- James D. Warnock
- et al.
- 1991
- IEEE T-ED
Electron beam tester measurements of switching noise in VLSI circuits
- Keith A. Jenkins
- David F. Heidel
- 1991
- Microelectronic Engineering
Electron-Beam Damage of Self-Aligned Silicon Bipolar Transistors and Circuits
- Keith A. Jenkins
- John D. Cressler
- 1991
- IEEE T-ED
Internal Node Probing of a DRAM with a Low-Temperature e-Beam Tester
- Keith A. Jenkins
- Walter H. Henkels
- 1991
- IEEE Journal of Solid-State Circuits
Ion Microbeam Probing of Sense Amplifiers to Analyze Single Event Upsets in a CMOS DRAM
- Linda M. Geppert
- David F. Heidel
- et al.
- 1991
- IEEE Journal of Solid-State Circuits