Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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2 results for Tuo Hung Hou

Origin of the threshold voltage instability in SiO₂/HfO₂ dual layer gate dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- IEEE Electron Device Letters
Recommended Methods to Study Resistive Switching Devices
- - Mario Lanza
  - H.-S. Philip Wong
  - et al.
- 2018
- Advanced Electronic Materials