Using adaptive read voltage thresholds to enhance the reliability of MLC NAND flash memory systemsNikolaos PapandreouThomas Parnellet al.2014GLSVLSI 2014
Modelling of the threshold voltage distributions of sub-20nm NAND flash memoryThomas ParnellNikolaos Papandreouet al.2014GLOBECOM 2014
Performance evaluation of the probe storage channelThomas P. ParnellHaralampos Pozidiset al.2009GLOBECOM 2009
Forward message passing detector for probe storageTom ParnellHaralampos Pozidiset al.2008IEEE ICC 2008