Publications

2 results for Niki Fokas

Hot Carrier Degradation and performance boost on Si Channel nFET Gate-All-Around Nanosheet Devices
- - H. Zhou
  - M. Hasanuzzaman
  - et al.
- 2025
- IRPS 2025
A Unified TDDB Model for BEOL Dielectrics of Various Structures and Thick FEOL Dielectrics
- - Kenji Okada
  - Kei Date
  - et al.
- 2024
- IEEE Transactions on Electron Devices