Analysis of the design space available for high-k gate dielectrics in nanoscale MOSFETs
- David J. Frank
- Hon-Sum P. Wong
- 2000
- Superlattices and Microstructures
Publications
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114 results for H.-S. Philip Wong
Future prospects for Si CMOS technology
- D.J. Frank
- Y. Taur
- et al.
- 1999
- DRC 1999
Characterization of the silicon on insulator film in bonded wafers by high resolution X-ray diffraction
- G.M. Cohen
- P.M. Mooney
- et al.
- 1999
- Applied Physics Letters
Nanoscale CMOS
- Hon-Sum Philip Wong
- David J. Frank
- et al.
- 1999
- Proceedings of the IEEE
Monitoring hot-carrier degradation in SOI MOSFET's by hot-carrier luminescence techniques
- Luca Selmi
- Maura Pavesi
- et al.
- 1998
- IEEE Transactions on Electron Devices
Digital imaging
- H.-S.Philip Wong
- J.P. Albert
- 1998
- IEEE Micro
Discrete random dopant distribution effects in nanometer-scale MOSFETs
- Hon-Sum Philip Wong
- Yuan Taur
- et al.
- 1998
- Microelectronics Reliability
Fabrication of ultrathin, highly uniform thin-film soi mosfet's with low series resistance using pattern-constrained epitaxy
- Hon-Sum Wong
- 1997
- IEEE Transactions on Electron Devices
CMOS scaling into the nanometer regime
- Yuan Taur
- Douglas A. Buchanan
- et al.
- 1997
- Proceedings of the IEEE
Technology and device scaling considerations for CMOS imagers
- Hon-Sum Wong
- 1996
- IEEE Transactions on Electron Devices