Performance evaluation of a high-quality TDI-CCD color scannerHon-Sum WongWhan-Soo Kanget al.1992IS&T/SPIE Electronic Imaging 1992
Experimental Verification of the Mechanism of Hot-Carrier-Induced Photon Emission in N-MOSFET's using an Overlapping CCD Gate StructureHon-Sum Wong1992IEEE Electron Device Letters
Experimental verification of the mechanism of hot-carrier-induced photon emission in n-MOSFET's with a CCD gate structureHon-Sum Wong1991IEDM 1991