Dependence of crystallographic texture of C54 TiSi2 on thickness and linewidth in submicron CMOS structures
- V. Svilan
- K.P. Rodbell
- et al.
- 1996
- MRS Spring Meeting 1996
Publications
Date
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194 results for Christian Lavoie
Light scattering measurement of surface topography during formation of titanium silicide
- C. Lavoie
- C. Cabral Jr.
- et al.
- 1995
- MRS Fall Meeting 1995
In situ analysis of the formation of thin TiSi2 (<50 nm) contacts in submicron CMOS structures during rapid thermal annealing
- L. Clevenger
- C. Cabral Jr.
- et al.
- 1995
- MRS Fall Meeting 1995
Challenges in the implementation of artificial intelligence hardware based on phase change devices
- Guy Cohen
- Amlan Majumdar
- et al.
- 2024
- MRS Fall Meeting 2024
Applications of Topological Semimetals for Post-Cu Interconnects
- Ching-Tzu Chen
- Hsin Lin
- et al.
- 2024
- MRS Spring Meeting 2024
Opportunities of topological semimetals as novel material for computing. Experimental transport studies and devices
- Heinz Schmid
- Alan Molinari
- et al.
- 2023
- MRS Spring Meeting 2023
Exploring Topological Semimetals for Highly Scaled Interconnects Beyond Copper
- Ching-Tzu Chen
- Christian Lavoie
- et al.
- 2023
- MRS Spring Meeting 2023
Identification of Structural Phases in Al Doped HfO2-based Ferroelectric Films by DFT-Assisted EXAFS Analysis
- M. Alper Sahiner
- Rory Vander Valk
- et al.
- 2023
- MRS Spring Meeting 2023
Exploring Unconventional Resistivity Scaling in Topological Semimetals for Interconnects Beyond Copper
- Ching-Tzu Chen
- Christian Lavoie
- et al.
- 2023
- APS March Meeting 2023
Epitaxial, Silicon-Compatible CoSi2 Thin Film SQUID with Constriction-Type Junction
- Ruoshui Li
- Yichen Jia
- et al.
- 2023
- APS March Meeting 2023