Robustness of ultrathin aluminum oxide dielectrics on Si(001)
- M. Copel
- E. Cartier
- et al.
- 2001
- Applied Physics Letters
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118 results for Supratik Guha
Ultrathin high-K gate stacks for advanced CMOS devices
- E. Gusev
- D.A. Buchanan
- et al.
- 2001
- Technical Digest - International Electron Devices Meeting
80 nm poly-silicon gated n-FETs with ultra-thin Al2O3 gate dielectric for ULSI applications
- D.A. Buchanan
- E. Gusev
- et al.
- 2000
- IEDM 2000
Atomic beam deposition of lanthanum- and yttrium-based oxide thin films for gate dielectrics
- S. Guha
- E. Cartier
- et al.
- 2000
- Applied Physics Letters
Thermal activation energies of Mg in GaN:Mg measured by the Hall effect and admittance spectroscopy
- D.J. Kim
- D.Y. Ryu
- et al.
- 2000
- Journal of Applied Physics
Raman spectroscopy of wurtzite InN films grown on Si
- F. Agulló-Rueda
- E. Mendez
- et al.
- 2000
- Solid State Communications
Transplanted Si films on arbitrary substrates using GaN underlayers
- Supratik Guha
- Arunava Gupta
- et al.
- 2000
- Applied Physics Letters
Admittance spectroscopy of Mg-doped GaN grown by molecular beam epitaxy using RF nitrogen sources
- D.J. Kim
- D.Y. Ryu
- et al.
- 1999
- Journal of the Korean Physical Society
Selective-area and lateral overgrowth of chromium dioxide (CrO2) films by chemical vapor deposition
- A. Gupta
- X.W. Li
- et al.
- 1999
- Applied Physics Letters
Selective area metalorganic molecular-beam epitaxy of GaN and the growth of luminescent microcolumns on Si/SiO2
- S. Guha
- N.A. Bojarczuk
- et al.
- 1999
- Applied Physics Letters