Mapping systematic and random process variations using light emission from off-state leakage
- Franco Stellari
- Peilin Song
- et al.
- 2009
- IRPS 2009
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61 results for Alan J. Weger
Product yield prediction system and critical area database
- Thomas S. Barnett
- Jeanne P. Bickford
- et al.
- 2008
- IEEE Trans Semicond Manuf
Thermal-aware task scheduling at the system software level
- Jeonghwan Choi
- Chen-Yong Cher
- et al.
- 2007
- ISLPED 2007
Temperature-limited microprocessors: Measurements and design implications
- Hendrik F. Hamann
- Alan Weger
- et al.
- 2007
- VLSID 2007
Product yield prediction system and critical area database
- Thomas S. Barnett
- Jeanne Bickford
- et al.
- 2007
- ASMC 2007
Hotspot-limited microprocessors: Direct temperature and power distribution measurements
- Hendrik F. Hamann
- Alan Weger
- et al.
- 2007
- IEEE Journal of Solid-State Circuits
Spatially-resolved imaging of microprocessor power (SIMP): Hotspots in microprocessors
- Hendrik F. Hamann
- James Lacey
- et al.
- 2006
- ITherm 2006
Power distribution measurements of the dual core PowerPC™ 970MP microprocessor
- Hendrik F. Hamann
- Alan Weger
- et al.
- 2006
- ISSCC 2006
High-voltage and high-power PLL diagnostics using advanced cooling and emission images
- Franco Stellari
- Peilin Song
- et al.
- 2006
- IEEE ITC 2006
An advanced optical diagnostic technique of IBM z990 eServer microprocessor
- Peilin Song
- Franco Stellari
- et al.
- 2005
- IEEE ITC 2005