Optimized Test Application Timing for AC Test
- Vijay S. Iyengar
- Gopalakrishnan Vijayan
- 1992
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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On Computing the Sizes of Detected Delay Faults
- Vijay S. Iyengar
- Barry K. Rosen
- et al.
- 1990
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems