Charge Catastrophe and Dielectric Breakdown during Exposure of Organic Thin Films to Low-Energy Electron Radiation
- A. Thete
- Daniël Geelen
- et al.
- 2017
- Physical Review Letters
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3 results for A. Thete
Low-energy electron (0-100eV) interaction with resists using LEEM
- A. Thete
- Daniël Geelen
- et al.
- 2015
- SPIE Advanced Lithography 2015
eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument
- Daniël Geelen
- A. Thete
- et al.
- 2015
- Ultramicroscopy