Defocus in cathode lens instruments
- Rudolf M. Tromp
- M.S. Altman
- 2017
- Ultramicroscopy
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A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM
- S.M. Schramm
- A.B. Pang
- et al.
- 2012
- Ultramicroscopy