High temperature electrical resistivity and Seebeck coefficient of Ge2Sb2Te5 thin films
- Lhacene Adnane
- Faruk Dirisaglik
- et al.
- 2017
- Journal of Applied Physics
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3 results for A.F.M. Anwar
Noise Performance of Si/Si1-xGex FET's
- A.F.M. Anwar
- Kuo-Wei Liu
- et al.
- 1995
- IEEE Transactions on Electron Devices
An analytical model of current-voltage characteristics and d.c. small-signal parameters for Si/Si1-xGex FETs
- Kuo-Wei Liu
- A.F.M. Anwar
- et al.
- 1994
- Solid State Electronics