Yield estimation of SRAM circuits using "Virtual SRAM Fab"
- Aditya Bansal
- Rama N. Singh
- et al.
- 2009
- ICCAD 2009
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88 results for Sani R. Nassif
An elegant hardware-corroborated statistical repair and test methodology for conquering aging effects
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2009
- ICCAD 2009
The Impact of BEOL Lithography Effects on the SRAM Cell Performance and Yield
- Ying Zhou
- Rouwaida Kanj
- et al.
- 2009
- ISQED 2009
Statistical yield analysis of silicon-on-insulator embedded DRAM
- R. Kanj
- R.V. Joshi
- et al.
- 2009
- ISQED 2009
Root-finding methods for assessing SRAM stability in the presence of random dopant fluctuations
- Rouwaida Kanj
- Zhuo Li
- et al.
- 2009
- IEEE Trans Semicond Manuf
Rigorous extraction of process variations for 65-nm CMOS design
- Wei Zhao
- Frank Liu
- et al.
- 2009
- IEEE Trans Semicond Manuf
SRAM methodology for yield and power efficiency: Per-element selectable supplies and memory reconfiguration schemes
- Rouwaida Kanj
- Rajiv V. Joshi
- et al.
- 2008
- ISLPED 2008
A root-finding method for assessing SRAM stability
- Rouwaida Kanj
- Zhuo Li
- et al.
- 2008
- ISQED 2008
Statistical evaluation of split gate opportunities for improved 8T/6T column-decoupled SRAM cell yield
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2008
- ISQED 2008
Design considerations for PD/SOI SRAM: Impact of gate leakage and threshold voltage variation
- Rouwaida Kanj
- Rajiv V. Joshi
- et al.
- 2008
- IEEE Trans Semicond Manuf