Electrically-driven retargeting for nanoscale layouts
- Shayak Banerjee
- Kanak B. Agarwal
- et al.
- 2011
- CICC 2011
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88 results for Sani R. Nassif
A 32nm 0.5V-supply dual-read 6T SRAM
- Jente B. Kuang
- J. Schaub
- et al.
- 2010
- CICC 2010
Statistical leakage modeling for accurate yield analysis: The CDF matching method and its alternatives
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2010
- ISLPED 2010
Tutorial proposal for ICM 2009
- Fadi Kurdahi
- Sani Nassif
- 2009
- ICM 2009
Yield estimation of SRAM circuits using "Virtual SRAM Fab"
- Aditya Bansal
- Rama N. Singh
- et al.
- 2009
- ICCAD 2009
An elegant hardware-corroborated statistical repair and test methodology for conquering aging effects
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2009
- ICCAD 2009
The Impact of BEOL Lithography Effects on the SRAM Cell Performance and Yield
- Ying Zhou
- Rouwaida Kanj
- et al.
- 2009
- ISQED 2009
Statistical yield analysis of silicon-on-insulator embedded DRAM
- R. Kanj
- R.V. Joshi
- et al.
- 2009
- ISQED 2009
SRAM methodology for yield and power efficiency: Per-element selectable supplies and memory reconfiguration schemes
- Rouwaida Kanj
- Rajiv V. Joshi
- et al.
- 2008
- ISLPED 2008
A root-finding method for assessing SRAM stability
- Rouwaida Kanj
- Zhuo Li
- et al.
- 2008
- ISQED 2008