SRAM yield sensitivity to supply voltage fluctuations and its implications on Vmin
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2007
- ICICDT 2007
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88 results for Sani R. Nassif
High performance CMOS variability in the 65nm regime and beyond
- Sani Nassif
- Kerry Bernstein
- et al.
- 2007
- IEDM 2007
Gate leakage effects on yield and design considerations of PD/SOI SRAM designs
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2007
- ISQED 2007
SRAM local bit line access failure analyses
- Praveen Elakkumanan
- Jente B. Kuang
- et al.
- 2006
- ISQED 2006
Analytical modeling of SRAM dynamic stability
- Bin Zhang
- Ari Arapostathis
- et al.
- 2006
- ICCAD 2006
A test structure for characterizing local device mismatches
- Kanak Agarwal
- Frank Liu
- et al.
- 2006
- VLSI Circuits 2006
Model to hardware matching for nano-meter scale technologies
- Sani R. Massif
- 2006
- ISLPED 2006
Circuit optimization using scale based sensitivities
- Bhavna Agrawal
- Frank Liu
- et al.
- 2006
- CICC 2006
System-level SRAM yield enhancement
- Fadi J. Kurdahi
- Ahmed M. Eltawil
- et al.
- 2006
- ISQED 2006
Characterization of total chip leakage using inverse (reciprocal) gamma distribution
- Emrah Acar
- Kanak Agarwal
- et al.
- 2006
- ISCAS 2006