Statistical evaluation of split gate opportunities for improved 8T/6T column-decoupled SRAM cell yield
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2008
- ISQED 2008
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88 results for Sani R. Nassif
SRAM yield sensitivity to supply voltage fluctuations and its implications on Vmin
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2007
- ICICDT 2007
Gate leakage effects on yield and design considerations of PD/SOI SRAM designs
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2007
- ISQED 2007
Accurate thermal analysis considering nonlinear thermal conductivity
- Anand Ramalingam
- Frank Liu
- et al.
- 2006
- ISQED 2006
Characterization of total chip leakage using inverse (reciprocal) gamma distribution
- Emrah Acar
- Kanak Agarwal
- et al.
- 2006
- ISCAS 2006
Model to hardware matching for nano-meter scale technologies
- Sani R. Massif
- 2006
- ISLPED 2006
SRAM local bit line access failure analyses
- Praveen Elakkumanan
- Jente B. Kuang
- et al.
- 2006
- ISQED 2006
Methods for estimating decoupling capacitance of non-switching circuit blocks
- Sani R. Nassif
- Kanak Agarwal
- et al.
- 2006
- ISCAS 2006
A test structure for characterizing local device mismatches
- Kanak Agarwal
- Frank Liu
- et al.
- 2006
- VLSI Circuits 2006
System-level SRAM yield enhancement
- Fadi J. Kurdahi
- Ahmed M. Eltawil
- et al.
- 2006
- ISQED 2006