The impact of statistical leakage models on design yield estimation
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2011
- VLSI Design
Publications
Date
Featured collections
Popular topics
88 results for Sani R. Nassif
T-VEMA: A Temperature-and Variation-Aware Electromigration Power Grid Analysis Tool
- Di-An Li
- Malgorzata Marek-Sadowska
- et al.
- 2015
- IEEE Transactions on VLSI Systems
Variability aware simulation based design-technology cooptimization (DTCO) Flow in 14 nm FinFET/SRAM cooptimization
- Asen Asenov
- Binjie Cheng
- et al.
- 2015
- IEEE T-ED
Shape slack: A design-manufacturing co-optimization methodology using tolerance information
- Shayak Banerjee
- Kanak B. Agarwal
- et al.
- 2013
- J. Micro/Nanolithogr. MEMS MOEMS
Simultaneous layout migration and decomposition for double patterning technology
- Chin-Hsiung Hsu
- Yao-Wen Chang
- et al.
- 2011
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
The design and characterization of a half-volt 32 nm dual-read 6T SRAM
- Jente B. Kuang
- Jeremy D. Schaub
- et al.
- 2011
- IEEE TCAS-I
Root-finding methods for assessing SRAM stability in the presence of random dopant fluctuations
- Rouwaida Kanj
- Zhuo Li
- et al.
- 2009
- IEEE Trans Semicond Manuf
Rigorous extraction of process variations for 65-nm CMOS design
- Wei Zhao
- Frank Liu
- et al.
- 2009
- IEEE Trans Semicond Manuf
Design considerations for PD/SOI SRAM: Impact of gate leakage and threshold voltage variation
- Rouwaida Kanj
- Rajiv V. Joshi
- et al.
- 2008
- IEEE Trans Semicond Manuf
High-performance CMOS variability in the 65-nm regime and beyond
- Kerry Bernstein
- David J. Frank
- et al.
- 2006
- IBM J. Res. Dev