Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction
- P.-C. Wang
- G.S. Cargill
- et al.
- 1998
- Applied Physics Letters
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66 results for I.C. Noyan
Mechanisms for microstructure evolution in electroplated copper thin films
- J.M.E. Harper
- C. Cabral Jr.
- et al.
- 1999
- MRS Spring Meeting 1999
Numerical simulation of the X-ray stress analysis technique in polycrystalline materials under elastic loading
- D. Chidambarrao
- Y.C. Song
- et al.
- 1997
- Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science
Effect of the specimen size in predicting the mechanical properties of PbSn solder alloys
- N.R. Bonda
- I.C. Noyan
- 1996
- IEEE Transactions on Components Packaging and Manufacturing Technology Part A
Local and global stress distributions in BEOL metallization
- I.C. Noyan
- E. Liniger
- et al.
- 1996
- MRS Spring Meeting 1996
The relationship between the golden section <z> and the elastic constants of ensembles selected by diffraction methods
- Conal E. Murray
- I.C. Noyan
- 1996
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Variation of the effective elastic constants in the sample coordinate system with tilt angle (ψ) for X-ray strain-stress analysis
- Yongchu Song
- I.C. Noyan
- 1996
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Quantitative measurement of the stress transfer function in nickel/polyimide thin film/copper thin film structures
- L.S. Schadler
- I.C. Noyan
- 1995
- Applied Physics Letters
Residual Stress/Strain Analysis in Thin Films by X-ray Diffraction
- B.R. York
- 1995
- Critical Reviews in Solid State and Materials Sciences
Determination of the mechanical response of thin films with x-rays
- I.C. Noyan
- G. Sheikh
- 1993
- MRS Spring Meeting 1993