Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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5 results for Tian Shen

Full Bottom Dielectric Isolation to Enable Stacked Nanosheet Transistor for Low Power and High Performance Applications
- - J. Zhang
  - S. Pancharatnam
  - et al.
- 2019
- IEDM 2019
BEOL/MOL TDDB Discussion Group
- - Tian Shen
- 2019
- IIRW 2019
A Flexible and Inherently Self-Consistent Methodology for MOL/BEOL/MIMCAP TDDB Applications with Excessive Variability-Induced Degradation
- - Ernest Wu
  - Ron Bolam
  - et al.
- 2022
- IRPS 2022
TDDB Reliability in Gate-All-Around Nanosheet
- - Huimei Zhou
  - Miaomiao Wang
  - et al.
- 2021
- IRPS 2021
A new technique for evaluating stacked nanosheet inner spacer TDDB reliability
- - Tian Shen
  - K. Watanabe
  - et al.
- 2020
- IRPS 2020