Field Effect and Strongly Localized Carriers in the Metal-Insulator Transition Material VO2
- Koen Martens
- Jaewoo Jeong
- et al.
- 2015
- Physical Review Letters
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Scanning spreading resistance microscopy for carrier profiling beyond 32nm node
- J. Modyl
- G. Zschatzsch
- et al.
- 2012
- IWJT 2012
Phase formation and thermal stability of ultrathin nickel-silicides on Si(100)
- K. De Keyser
- C. Van Bockstael
- et al.
- 2010
- Applied Physics Letters