Characterization and analysis of gate-induced-drain-leakage current in 45 nm CMOS technology
- Xiaobin Yuan
- Jae-Eun Park
- et al.
- 2007
- IIRW 2007
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6 results for Xiaobin Yuan
Design Considerations for Reconfigurable Delay Circuit to Emulate System Critical Paths
- Xiaobin Yuan
- Pawel Owczarczyk
- et al.
- 2015
- IEEE Transactions on VLSI Systems
Transistor mismatch properties in deep-submicrometer CMOS technologies
- Xiaobin Yuan
- Takashi Shimizu
- et al.
- 2011
- IEEE T-ED
Gate-induced-drain-leakage current in 45-nm CMOS technology
- Xiaohin Yuan
- Jae-Eun Park
- et al.
- 2008
- IEEE T-DMR
Superposition model for dielectric charging of RF MEMS capacitive switches under bipolar control-voltage waveforms
- Zhen Peng
- Xiaobin Yuan
- et al.
- 2007
- IEEE T-MTT
Acceleration of dielectric charging in RF MEMS capacitive switches
- Xiaobin Yuan
- Zhen Peng
- et al.
- 2006
- IEEE T-DMR