Gate stack resistance and limits to CMOS logic performance
- Richard A. Wachnik
- Sungjae Lee
- et al.
- 2014
- IEEE TCAS-I
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23 results for Ning Lu
Modeling of distance-dependent mismatch and across-chip variations in semiconductor devices
- Ning Lu
- 2014
- IEEE T-ED
Modeling of variation in submicrometer CMOS ULSI technologies
- Scott K. Springer
- Sungjae Lee
- et al.
- 2006
- IEEE Transactions on Electron Devices