Scanning tunneling microscopy as a tool to study surface roughness of sputtered thin films
- C. Schönenberger
- S.F. Alvarado
- et al.
- 1989
- Journal of Applied Physics
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.