Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
- Tino Wagner
- Hannes Beyer
- et al.
- 2015
- Beilstein Journal of Nanotechnology
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.