Publications

3 results for M. Hasanuzzaman

Hot Carrier Degradation and performance boost on Si Channel nFET Gate-All-Around Nanosheet Devices
- - H. Zhou
  - M. Hasanuzzaman
  - et al.
- 2025
- IRPS 2025
High Performance Nanosheet Technology Optimized for 77 K
- - R. Bao
  - L. Qin
  - et al.
- 2023
- IEDM 2023
High performance 14nm SOI FinFET CMOS technology with 0.0174μm² embedded DRAM and 15 levels of Cu metallization
- - C.-H.C-H. Lin
  - Brian Greene
  - et al.
- 2014
- IEDM 2014