Guest Editorial: Special section on emerging trends and computing paradigms for testing, reliability and security in future VLSI systems
- Stefano Di Carlo
- Peilin Song
- et al.
- 2021
- IEEE TETC
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Guest Editors' Introduction: Selected Papers from IEEE VLSI Test Symposium
- Stefano Di Carlo
- Peilin Song
- et al.
- 2020
- IEEE Design and Test