Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

Date

Start

End

Featured collections

Popular topics

14 results for M.R. Shaneyfelt

Single-event upsets and multiple-bit upsets on a 45 nm SOI SRAM
- - David F. Heidel
  - Paul W. Marshall
  - et al.
- 2009
- IEEE TNS
Low energy proton single-event-upset test results on 65 nm SOI SRAM
- - David F. Heidel
  - Paul W. Marshall
  - et al.
- 2008
- IEEE TNS
Charge trapping and annealing in high-k gate dielectrics
- - James A. Felix
  - Marty R. Shaneyfelt
  - et al.
- 2004
- IEEE TNS
Effects of radiation and charge trapping on the reliability of high- κ gate dielectrics
- - J.A. Felix
  - J.R. Schwank
  - et al.
- 2004
- Microelectronics Reliability