Design and optimization of scr devices for on-chip esd protection in advanced SOI CMOS technologies
- Junjun Li
- James Di Sarro
- et al.
- 2012
- EOS/ESD 2012
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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27 results for Junjun Li
Effect of embedded-sige eSiGeon ESD TLP and VFTLP characteristics of diode-triggered silicon controlled rectifiers DTSCRs
- Rahul Mishra
- Junjun Li
- et al.
- 2012
- EOS/ESD 2012
Technology scaling effects on the ESD performance of silicide-blocked PMOSFET devices in nanometer bulk CMOS technologies
- Junjun Li
- Rahul Mishra
- et al.
- 2011
- EOS/ESD 2011
Pulsed gate dielectric breakdown in a 32 nm technology under different ESD stress configurations
- Yang Yang
- Robert Gauthier
- et al.
- 2010
- EOS/ESD 2010
Predictive full circuit ESD simulation and analysis using extended ESD compact models: Methodology and tool implementation
- Junjun Li
- Robert Gauthier
- et al.
- 2010
- EOS/ESD 2010
Characterization of high-k/metal gate stack breakdown in the time scale of ESD events
- Yang Yang
- James Di Sarro
- et al.
- 2010
- IRPS 2010
Technology scaling of advanced bulk CMOS on-chip ESD protection down to the 32nm node
- Junjun Li
- Kiran Chatty
- et al.
- 2009
- EOS/ESD 2009
ESD time-domain characterization of high-k gate dielectric in a 32 nm CMOS technology
- James Di Sarro
- Yang Yang
- et al.
- 2009
- EOS/ESD 2009
Capacitance investigation of diode and GGNMOS for ESD protection of high frequency circuits in 45nm SOI CMOS technologies
- Junjun Li
- Souvick Mitra
- et al.
- 2008
- EOS/ESD 2008
Channel Strain Characterization in Embedded SiGe by Nano-beam Diffraction
- J. Li
- A. Lamberti
- et al.
- 2008
- ECS Meeting 2008