Divergence effects in monochromatic x-ray microdiffraction using tapered capillary optics
- I.C. Noyan
- P.-C. Wang
- et al.
- 2000
- Review of Scientific Instruments
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152 results for Jean L. Jordan-Sweet
Images of local tilted regions in strain-relaxed SiGe layers
- P.M. Mooney
- J.L. Jordan-Sweet
- et al.
- 1999
- Physica B: Condensed Matter
Observation of local tilted regions in strain-relaxed SiGe/Si buffer layers using x-ray microdiffraction
- P.M. Mooney
- J.L. Jordan-Sweet
- et al.
- 1999
- Applied Physics Letters
In situ characterization of titanium silicide formation: The effect of Mo interlayer, temperature ramp-rate, and annealing atmosphere
- S.-L. Zhang
- C. Lavoie
- et al.
- 1999
- Journal of Applied Physics
A cost-effective method for minimizing the sphere-of-confusion error of x-ray microdiffractometers
- I.C. Noyan
- S. Kaldor
- et al.
- 1999
- Review of Scientific Instruments
Interdiffusion studies of single crystal TiN/NbN superlattice thin films
- C. Engström
- J. Birch
- et al.
- 1999
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Characterization of substrate/thin-film interfaces with x-ray microdiffraction
- I.C. Noyan
- J.L. Jordan-Sweet
- et al.
- 1998
- Applied Physics Letters
X-ray diffraction analysis of SiGe/Si heterostructures on sapphire substrates
- P.M. Mooney
- J.A. Ott
- et al.
- 1998
- Applied Physics Letters
Effect of surface-influenced order on thermal expansivity of polymer thin films
- C. Thompson
- Ravi F. Saraf
- et al.
- 1997
- Langmuir
Phase formation sequences in the silicon-phosphorus system: Determined by in-situ synchrotron and conventional X-ray diffraction measurements and predicted by a theoretical model
- J.R.A. Carlsson
- L. Clevenger
- et al.
- 1997
- Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties