Dependence of crystallographic texture of C54 TiSi2 on thickness and linewidth in submicron CMOS structures
- V. Svilan
- K.P. Rodbell
- et al.
- 1996
- MRS Spring Meeting 1996
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152 results for Jean L. Jordan-Sweet
Light scattering measurement of surface topography during formation of titanium silicide
- C. Lavoie
- C. Cabral Jr.
- et al.
- 1995
- MRS Fall Meeting 1995
In situ analysis of the formation of thin TiSi2 (<50 nm) contacts in submicron CMOS structures during rapid thermal annealing
- L. Clevenger
- C. Cabral Jr.
- et al.
- 1995
- MRS Fall Meeting 1995
High-resolution x-ray diffraction measurements of SiGe/Si structures
- J.L. Jordan-Sweet
- P.M. Mooney
- et al.
- 1994
- MRS Fall Meeting 1994
Switching of ferroelectric polarization in epitaxial BaTiO 3 films on silicon without a conducting bottom electrode
- Catherine Dubourdieu
- John Bruley
- et al.
- 2013
- Nature Nanotechnology
Solution-phase deposition and nanopatterning of GeSbSe phase-change materials
- Delia J. Milliron
- Simone Raoux
- et al.
- 2007
- Nature Materials
An off-normal fibre-like texture in thin films on single-crystal substrates
- C. Detavernier
- A.S. Özcan
- et al.
- 2003
- Nature
Observation of columnar microstructure in step-graded Si1-xGex/Si films using high-resolution X-ray microdiffraction
- D.E. Eastman
- C.B. Stagarescu
- et al.
- 2002
- Physical Review Letters
Observation of Columnar Microstructure in Step-Graded [Formula presented] Films Using High-Resolution X-Ray Microdiffraction
- D.E. Eastman
- C.B. Stagarescu
- et al.
- 2002
- Physical Review Letters
Small-angle x-ray-scattering study of ordering kinetics in a block copolymer
- C.R. Harkless
- M.A. Singh
- et al.
- 1990
- Physical Review Letters