Publications

156 results for Jean L. Jordan-Sweet

Texture of CoSi₂ films on Si(111), (110) and (001) substrates
- - K. De Keyser
  - C. Detavernier
  - et al.
- 2010
- Thin Solid Films
Phase formation and stability of Ni silicide contacts - Scaling to ultra-thin films
- - C. Detavernier
  - K. De Keyser
  - et al.
- 2010
- ICSICT 2010
Heteroepitaxial silicon film growth at 600 °c from an Al-Si eutectic melt
- - P. Chaudhari
  - Heejae Shim
  - et al.
- 2010
- Thin Solid Films
Phase formation and thermal stability of ultrathin nickel-silicides on Si(100)
- - K. De Keyser
  - C. Van Bockstael
  - et al.
- 2010
- Applied Physics Letters
Understanding tunneling magnetoresistance during thermal annealing in MgO-based junctions with CoFeB electrodes
- - Weigang Wang
  - C. Ni
  - et al.
- 2010
- Physical Review B - CMMP
Texture of cobalt germanides on Ge(100) and Ge(111) and its influence on the formation temperature
- - K. De Keyser
  - R.L. Van Meirhaeghe
  - et al.
- 2010
- JES
Irreversible altering of crystalline phase of phase-change Ge-Sb thin films
- - Lia Krusin-Elbaum
  - D. Shakhvorostov
  - et al.
- 2010
- Applied Physics Letters
Effects of annealing on the local structure of Fe and Co in CoFeB/MgO/CoFeB tunnel junctions: An extended x-ray-absorption fine structure study
- - Abdul K. Rumaiz
  - J.C. Woicik
  - et al.
- 2010
- Applied Physics Letters
In situ X-ray diffraction study of thin film Ir/Si solid state reactions
- - W. Knaepen
  - J. Demeulemeester
  - et al.
- 2010
- Microelectronic Engineering
In situ study of the formation of silicide phases in amorphous Co-Si mixed layers
- - C. Van Bockstael
  - K. De Keyser
  - et al.
- 2010
- Microelectronic Engineering